The MIL-STD-883 standard establishes consistent methods, controls, and procedures for testing microelectronic devices that are appropriate for use in military and aerospace electronic systems. These include environmental, mechanical, and electrical tests; workmanship and training procedures; and other controls and constraints needed to confirm uniformity in quality and reliability. Microelectronic devices include monolithic, multichip, film, and hybrid microcircuits; microcircuit arrays; and the elements from which the circuits and arrays are formed. Summarized below are some of the MIL-STD-883 test methods used for the irradiation of parts.

MIL-STD-883E, Method 1017 – Neutron Irradiation: This test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. This is a destructive test. It is applicable to integrated circuits, transistors, and diodes. Its aims are to detect the degradation of semiconductor device parameters as a function of neutron fluence and to determine whether parameters are within specified limits after exposure to a specified level of neutron fluence.

MIL-STD-883E, Notice 1, Method 1019 – Ionizing Radiation (Total Dose) Test Procedure: This test defines requirements for testing packaged semiconductor integrated circuits for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. It also provides an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. It is a destructive test.

MIL-STD-883E, Notice 1, Method 1020 – Dose Rate Induced Latchup Test Procedure: This test defines requirements for performing latchup testing of microcircuits to identify susceptibility to dose-rate induced latchup.

MIL-STD-883E, Notice 1, Method 1021 – Dose Rate Upset Testing of Digital Microcircuits: This procedure defines the requirements for testing the response of packaged digital integrated circuits to pulsed ionizing radiation. A flash x-ray or linear accelerator pulses ionizing radiation. Responses include transient output signals; changes in the state of internal storage elements; and transient current surges at inputs, outputs, and power supply connections.

These are just a few of the many MIL-STD-883 standards. Blackfox offers a MIL-STD-883 Revision H course covering wires package conditions, monolithic single die inspection, and hybrid packages. If you are an electronics systems technician or an aspiring one interested in MIL-STD methods, check out this course at one of the nation’s best technical training institutes.

Sources:

1. Texas Instruments. Radiation Owner’s Manual.

2. Wikipedia. MIL-STD-883