This course is designed to familiarize the learner with the details included in specific sections of the MIL-STD 883 Test Method Standard Microcircuits and MIL-STD 750 Test Method Standard for Semiconductor Devices. This may be used in conjunction with your company’s internal documents. This course consists of lecture and hands-on sections, using a microscope with actual parts (high and low power) and video presentations of anomalies. This will teach new inspectors inspection skills and enhance inspector skills for those with previous or partial inspection skills.

Mil-STD-883 Revision H Course

  • Section 2009 Low Power/ wires package conditions external visual and high power
  • Section 2010 Monolithic (single die) inspection
  • Section 2017 Wires/ Package Conditions
  • Section 2032 Hybrid packages (multiple die and passive components/ substrates) Low and High Power

What the Learner Receives:

  • Student manual
  • Blackfox Certification
  • Course duration for Mil-STD 883: 3 days
  • Certification valid for 12 months

Mil-STD-750 Revision E (transistors and diodes) Course

  • Section 2071 Low Power- wires, package conditions, external visual
  • Section 2069-2070 Fets/ Chips
  • Section 2072 Transistors/ Chips
  • Section 2073 Diodes/ Chips
  • Section 2074 Diodes/ glass bodied-encapsulated

What the Learner Receives:

  • Student manual
  • Blackfox Certification
  • Course duration for Mil-STD: 1 day
  • Certification valid for 12 months